Surface-Selective X-Ray Topographic Observations of Mechano-Chemical Polished Silicon Surfaces.
نویسندگان
چکیده
منابع مشابه
Unsupervised Classification of X-Ray Mapping Images of Polished Sections
X-ray mapping images of polished sections are classified using two unsupervised clustering algorithms. The methods applied are the k-means algorithm and an extended spectral fuzzy c-means algorithm. The extentions include new types of memberships that are related to the contextual information. In addition to the traditional spectral membership we apply a spatial membership and a parental member...
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ژورنال
عنوان ژورنال: Nihon Kessho Gakkaishi
سال: 1993
ISSN: 0369-4585,1884-5576
DOI: 10.5940/jcrsj.35.282